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A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices.

G. PedreiraJavier Martín-MartínezJavier Diaz-FortunyPablo Saraza-CanflancaRosana RodríguezRafael Castro-LópezElisenda RocaFrancisco V. FernándezMontserrat Nafría
Published in: IRPS (2019)
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