Pablo Martín-Lloret

Publication Activity (10 Years)

Years Active: 2016-2022
Publications (10 Years): 8

Top Topics

Pareto Optimality

Simulation Tool

Reliability Assessment

Stochastic Model

Top Venues

Publications

Andrés Santana-Andreo, Pablo Martín-Lloret, Elisenda Roca, Rafael Castro-López, Francisco V. Fernández
Characterization and analysis of BTI and HCI effects in CMOS current mirrors. SMACD (2022)
Pablo Martín-Lloret, Juan Núñez, Elisenda Roca, Rafael Castro-López, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks. SMACD (2019)
Antonio Toro-Frías, Pablo Saraza-Canflanca, Fábio Passos, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator. DATE (2019)
Antonio Toro-Frías, Pablo Martín-Lloret, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
Lifetime Calculation Using a Stochastic Reliability Simulator for Analog ICs. SMACD (2018)
Pablo Martín-Lloret, Antonio Toro-Frías, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría
CASE: A reliability simulation tool for analog ICs. SMACD (2017)
Antonio Toro-Frías, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría
Including a stochastic model of aging in a reliability simulation flow. SMACD (2017)
Pablo Martín-Lloret, Antonio Toro-Frías, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
A size-adaptive time-step algorithm for accurate simulation of aging in analog ICs. ISCAS (2017)
Antonio Toro-Frías, Pablo Martín-Lloret, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
Reliability simulation for analog ICs: Goals, solutions, and challenges. Integr. 55 (2016)