An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks.
Pablo Martín-LloretJuan NúñezElisenda RocaRafael Castro-LópezJavier Martín-MartínezRosana RodríguezMontserrat NafríaFrancisco V. FernándezPublished in: SMACD (2019)