New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors.
Pablo Saraza-CanflancaJavier Diaz-FortunyRafael Castro-LópezElisenda Roca MorenoJavier Martín-MartínezRosana RodríguezMontserrat NafríaFrancisco V. FernándezPublished in: DATE (2019)
Keyphrases
- synthetic data
- classification method
- detection method
- segmentation method
- genetic algorithm
- prior knowledge
- significant improvement
- cost function
- dynamic programming
- high accuracy
- power consumption
- neural network
- steady state
- clustering method
- feature set
- classification accuracy
- computational cost
- objective function
- similarity measure
- image sequences
- learning algorithm