Limeng Shi

Publication Activity (10 Years)

Years Active: 2023-2024
Publications (10 Years): 4

Top Topics

Evaluation Method

Benchmark Datasets

Leakage Current

Top Venues

Publications

Limeng Shi, Jiashu Qian, Michael Jin, Monikuntala Bhattacharya, Hengyu Yu, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori
Evaluation of Burn-in Technique on Gate Oxide Reliability in Commercial SiC MOSFETs. IRPS (2024)
Jiashu Qian, Limeng Shi, Michael Jin, Monikuntala Bhattacharya, Hengyu Yu, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori, Tianshi Liu, Shengnan Zhu
Investigation of the Electron Trapping in Commercial Thick Silicon Dioxides Thermally Grown on 4H-SiC under the Constant Current Stress. IRPS (2024)
Limeng Shi, Shengnan Zhu, Jiashu Qian, Michael Jin, Monikuntala Bhattacharya, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori, Tianshi Liu
Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs. IRPS (2023)
Shengnan Zhu, Limeng Shi, Michael Jin, Jiashu Qian, Monikuntala Bhattacharya, Hema Lata Rao Maddi, Marvin H. White, Anant K. Agarwal, Tianshi Liu, Atsushi Shimbori, Chingchi Chen
Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs. IRPS (2023)