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Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs.

Limeng ShiShengnan ZhuJiashu QianMichael JinMonikuntala BhattacharyaMarvin H. WhiteAnant K. AgarwalAtsushi ShimboriTianshi Liu
Published in: IRPS (2023)
Keyphrases
  • machine learning
  • data sets
  • significant improvement
  • empirical studies
  • benchmark datasets
  • machine learning methods
  • statistical methods