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Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs.

Shengnan ZhuLimeng ShiMichael JinJiashu QianMonikuntala BhattacharyaHema Lata Rao MaddiMarvin H. WhiteAnant K. AgarwalTianshi LiuAtsushi ShimboriChingchi Chen
Published in: IRPS (2023)
Keyphrases
  • reliability analysis
  • power consumption
  • database
  • genetic algorithm
  • social networks
  • multi agent systems
  • low cost
  • high speed
  • single point