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Evaluation of Burn-in Technique on Gate Oxide Reliability in Commercial SiC MOSFETs.
Limeng Shi
Jiashu Qian
Michael Jin
Monikuntala Bhattacharya
Hengyu Yu
Marvin H. White
Anant K. Agarwal
Atsushi Shimbori
Published in:
IRPS (2024)
Keyphrases
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