Yiming Qu

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 15

Top Topics

High Throughput

Bayes Error Rate

Top Venues

Sci. China Inf. Sci.

Int. J. Inf. Commun. Technol.

Microelectron. Reliab.

Publications

Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao
Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs. IRPS (2024)
Zeping Weng, Zhangsheng Lan, Yaru Ding, Yiming Qu, Yi Zhao
Orthorhombic-I Phase and Related Phase Transitions: Mechanism of Superior Endurance $(> 10^{14})$ of HfZrO Anti-ferroelectrics for DRAM Applications. IRPS (2024)
Yiming Qu, Chu Yan, Yaru Ding, Yi Zhao
Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs. IRPS (2024)
Yaru Ding, Xinwei Yu, Chu Yan, Zeping Weng, Yiming Qu, Yi Zhao
Interval time dependent wake-up effect of HfZrO ferroelectric capacitor. IRPS (2023)
Yiming Qu, Chu Yan, Xinwei Yu, Yaru Ding, Yi Zhao
GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States. IRPS (2023)
Xinwei Yu, Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao
GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model. IRPS (2023)
Yiming Qu, I-Hua Chen, Shangjie Meng
Multimedia teaching resource allocation method for distance online education based on packet cluster mapping. Int. J. Inf. Commun. Technol. 23 (4) (2023)
Yiming Qu, Yang Shen, Mingji Su, Jiwu Lu, Yi Zhao
GHz C-V Characterization Methodology and Its Application for Understanding Polarization Behaviors in High-k Dielectric Films. IRPS (2022)
Yaru Ding, Wei Liu, Yiming Qu, Liang Zhao, Yi Zhao
Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress. IRPS (2022)
Chu Yan, Yaru Ding, Yiming Qu, Liang Zhao, Yi Zhao
Universal Hot Carrier Degradation Model under DC and AC Stresses. IRPS (2022)
Ran Cheng, Ying Sun, Yiming Qu, Wei Liu, Fanyu Liu, Jianfeng Gao, Nuo Xu, Bing Chen
Nano-scaled transistor reliability characterization at nano-second regime. Sci. China Inf. Sci. 64 (10) (2021)
Yiming Qu, Jiwu Lu, Junkang Li, Zhuo Chen, Jie Zhang, Chunlong Li, Shiuh-Wuu Lee, Yi Zhao
In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation. IRPS (2020)
Shifan Gao, Bing Chen, Nuo Xu, Yiming Qu, Yi Zhao
Probing Write Error Rate and Random Telegraph Noise of MgO Based Magnetic Tunnel Juction Using a High Throughput Characterization System. IRPS (2019)
Yiming Qu, Ran Cheng, Wei Liu, Junkang Li, Bich-Yen Nguyen, Olivier Faynot, Nuo Xu, Bing Chen, Yi Zhao
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs. IRPS (2018)
Yiming Qu, Bing Chen, Wei Liu, Jinghui Han, Jiwu Lu, Yi Zhao
Sub-1 ns characterization methodology for transistor electrical parameter extraction. Microelectron. Reliab. 85 (2018)