Login / Signup

Nano-scaled transistor reliability characterization at nano-second regime.

Ran ChengYing SunYiming QuWei LiuFanyu LiuJianfeng GaoNuo XuBing Chen
Published in: Sci. China Inf. Sci. (2021)
Keyphrases
  • nano scale
  • carbon nanotubes
  • high speed
  • atomic force microscopy
  • knowledge base
  • neural network
  • low power
  • real time
  • information retrieval
  • genetic algorithm
  • digital libraries
  • low cost
  • highly reliable