Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress.

Yaru Ding Wei Liu Yiming Qu Liang Zhao Yi Zhao

Published in: IRPS (2022)

Keyphrases

cmos technology
silicon on insulator
nm technology
high speed
metal oxide semiconductor
power consumption
low power
control algorithm
low cost
integrated circuit
analog vlsi
transmission electron microscopy
human behavior
dynamic behavior
fuzzy controller
behavior patterns
delay insensitive
real time