BAYES ERROR RATE
Experts
- Sergio Verdú
- Hee-Joong Kang
- Dan A. Simovici
- Mika Göös
- Marek Karpinski
- Igal Sason
- Szymon Jaroszewicz
- Juho Hirvonen
- Jukka Suomela
- Marc Vuffray
- Dengyong Zhou
- Jingxian Wu
- Jiucheng Xu
- Nicolas Macris
- Jiang Wen
- Quentin Mérigot
- Wington L. Vital
- John C. Platt
- Klaus Ritter
- Michael G. Jabbour
- Timothy L. Molloy
- Seong-Whan Lee
- Siu-Wai Ho
- Guilherme Vieira
- David Burshtein
- Ian S. Fischer
- Nilanjana Datta
- Girish N. Nair
- Ohad Barak
- Christopher Meek
- Gang Wang
- Qiang Liu
- Yahong Rosa Zheng
- Richard Schmied
- Wing Hung Wong
- Xiaolin Wu
- Norman C. Beaulieu
- Thomas Müller-Gronbach
- Marcos Eduardo Valle
Venues
- CoRR
- IEEE Trans. Inf. Theory
- Entropy
- ISIT
- IEEE Trans. Pattern Anal. Mach. Intell.
- IRPS
- ICPR
- Int. J. Mach. Learn. Cybern.
- ICC
- Electron. Colloquium Comput. Complex.
- IEEE Trans. Commun.
- Biomed. Signal Process. Control.
- IEEE Trans. Signal Process.
- PODC
- CISIS-ICEUTE
- J. Signal Process. Syst.
- ICASSP
- PAKDD
- IACR Cryptol. ePrint Arch.
- Multiple Classifier Systems
- PCM
- IEEE Trans. Image Process.
- Pattern Recognit.
- ICDAR
- Algorithms and Complexity for Continuous Problems
- IEEE Trans. Syst. Man Cybern.
- Fuzzy Sets Syst.
- EGC
- IWPT
- ECML/PKDD (5)
- Neural Networks
- ICICA (2)
- SIAM J. Sci. Comput.
- SIAM J. Matrix Anal. Appl.
- ICML
- IWINAC (1)
- J. Mach. Learn. Res.
- IJCNN
- RSKT
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