BAYES ERROR RATE
Experts
- Sergio Verdú
- Hee-Joong Kang
- Dan A. Simovici
- Jukka Suomela
- Mika Göös
- Juho Hirvonen
- Marek Karpinski
- Szymon Jaroszewicz
- Igal Sason
- Jiang Wen
- Devansh Arpit
- Qiang Liu
- Girish N. Nair
- Huan Wang
- Richard Schmied
- Gang Wang
- Dengyong Zhou
- Jiucheng Xu
- Norman C. Beaulieu
- John C. Platt
- Seong-Whan Lee
- Klaus Ritter
- Shelby Heinecke
- Timothy L. Molloy
- Silvio Savarese
- Thomas Müller-Gronbach
- Wing Hung Wong
- Christopher Meek
- David Burshtein
- Caiming Xiong
- Xiaolin Wu
- Jingxian Wu
- Yahong Rosa Zheng
- Nilanjana Datta
- Juan Carlos Niebles
- Weiran Yao
- Nicolas Macris
- Siu-Wai Ho
- Guilherme Vieira
Venues
- CoRR
- IEEE Trans. Inf. Theory
- Entropy
- ISIT
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Commun.
- Biomed. Signal Process. Control.
- Int. J. Mach. Learn. Cybern.
- ICPR
- IRPS
- Electron. Colloquium Comput. Complex.
- ICC
- Fuzzy Sets Syst.
- SIAM J. Sci. Comput.
- IEEE Trans. Syst. Man Cybern.
- Appl. Math. Comput.
- ICML
- Comput. Complex.
- Quantum
- UAI
- SIAM J. Matrix Anal. Appl.
- Algorithms and Complexity for Continuous Problems
- PCM
- Wirel. Pers. Commun.
- ICTC
- EGC
- PAKDD
- ECML/PKDD (5)
- IACR Cryptol. ePrint Arch.
- Computational Complexity of Discrete Problems
- CLeaR
- IWINAC (1)
- IJCNN
- J. Comb. Optim.
- ICDAR
- IEEE Trans. Signal Process.
- ICASSP (4)
- VLSI Technology and Circuits
- IEICE Trans. Commun.
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