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Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs.
Yiming Qu
Ran Cheng
Wei Liu
Junkang Li
Bich-Yen Nguyen
Olivier Faynot
Nuo Xu
Bing Chen
Yi Zhao
Published in:
IRPS (2018)
Keyphrases
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real time
high speed
evolutionary algorithm
case study
multiresolution
behavior analysis
database
databases
data mining
learning algorithm
artificial intelligence
computer vision
processing speed
dynamic behavior
highly reliable
behavior recognition