Orthorhombic-I Phase and Related Phase Transitions: Mechanism of Superior Endurance $(> 10^{14})$ of HfZrO Anti-ferroelectrics for DRAM Applications.
Zeping WengZhangsheng LanYaru DingYiming QuYi ZhaoPublished in: IRPS (2024)
Keyphrases
- phase transition
- random constraint satisfaction problems
- constraint satisfaction
- satisfiability problem
- randomly generated
- combinatorial problems
- main memory
- security protection
- hard problems
- random graphs
- high density
- graph coloring
- evolutionary algorithm
- boolean satisfiability
- deep structure
- evaluation function
- np complete