DEEP STRUCTURE
Experts
- Luc Florack
- Bart M. ter Haar Romeny
- Tony Lindeberg
- Arjan Kuijper
- Max A. Viergever
- Andreas Weiermann
- Atsushi Imiya
- Joachim Weickert
- Tomoya Sakai
- Alfons H. Salden
- Emanuele Natale
- J. Andrew Bangham
- Songde Ma
- Tad Hogg
- Pascal Peter
- Mohab Safey El Din
- Francesco D'Amore
- Jean-Michel Morel
- Richard W. Harvey
- Jon Sporring
- Colin P. Williams
- Alison Bosson
- Jan J. Koenderink
- Pierre-Jean Spaenlehauer
- André Nusser
- Peter Johansen
- Mads Nielsen
- Juan Carlos Vera
- Martin Tschirsich
- Nir A. Sochen
- Emilio Cruciani
- Daniel Fagerström
- Linji Yang
- Tomasz Luczak
- Yulong Liu
- Giacomo Scornavacca
- Weixiong Zhang
- Kuldeep S. Meel
- Hervé Daudé
Venues
- CoRR
- Scale-Space
- J. Math. Imaging Vis.
- IEEE Trans. Pattern Anal. Mach. Intell.
- SSVM
- Entropy
- ICASSP
- ICIP
- Symmetry
- ICPR
- Comput. Phys. Commun.
- Quantum Inf. Process.
- IEEE Access
- Random Struct. Algorithms
- SIAM J. Math. Anal.
- Int. J. Comput. Vis.
- Int. J. Bifurc. Chaos
- Pattern Recognit.
- DSSCV
- J. Comput. Chem.
- AAAI
- IEEE Trans. Image Process.
- CVPR
- NIPS
- NeurIPS
- SIAM J. Appl. Math.
- IEEE Trans. Vis. Comput. Graph.
- Appl. Math. Comput.
- IJCAI
- Remote. Sens.
- Artif. Intell.
- ECCV (1)
- Image Vis. Comput.
- EUSIPCO
- Biomed. Signal Process. Control.
- Multim. Tools Appl.
- SIAM J. Optim.
- BMVC
- J. Glob. Optim.
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