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Jinghui Han
Publication Activity (10 Years)
Years Active: 2017-2018
Publications (10 Years): 3
Top Topics
High Reliability
Equivalent Circuit
Parameter Values
Statistical Methods
Top Venues
ASICON
Microelectron. Reliab.
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Publications
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Yiming Qu
,
Bing Chen
,
Wei Liu
,
Jinghui Han
,
Jiwu Lu
,
Yi Zhao
Sub-1 ns characterization methodology for transistor electrical parameter extraction.
Microelectron. Reliab.
85 (2018)
Rui Zhang
,
Jinghui Han
,
Junkang Li
,
Xiaoyu Tang
,
Yi Zhao
NiGe metal source/drain Ge pMOSFETs for future high performance VLSI circuits applications.
ASICON
(2017)
Jinghui Han
,
Yao Zhou
,
Hao Ni
,
Xiao Zheng
,
Yi Zhao
A 55nm logic process compatible p-flash memory array fully demonstrated with high reliability.
ASICON
(2017)