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NiGe metal source/drain Ge pMOSFETs for future high performance VLSI circuits applications.

Rui ZhangJinghui HanJunkang LiXiaoyu TangYi Zhao
Published in: ASICON (2017)
Keyphrases
  • vlsi circuits
  • long term
  • low power
  • real time
  • low cost
  • model checking