Login / Signup
Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs.
Yiming Qu
Chu Yan
Yaru Ding
Yi Zhao
Published in:
IRPS (2024)
Keyphrases
</>
high speed
real time
artificial intelligence
image segmentation
expert systems
multiresolution
multispectral