Universal Hot Carrier Degradation Model under DC and AC Stresses.
Chu YanYaru DingYiming QuLiang ZhaoYi ZhaoPublished in: IRPS (2022)
Keyphrases
- computer vision
- real time
- experimental data
- mathematical model
- probability distribution
- databases
- parameter values
- formal model
- theoretical framework
- input data
- management system
- computational model
- cost function
- prior knowledge
- statistical model
- high level
- conceptual model
- sensitivity analysis
- neural network model
- simulation model
- social networks
- neural network