Inanc Meric

Publication Activity (10 Years)

Years Active: 2008-2024
Publications (10 Years): 11

Top Topics

Advanced Technology

Top Venues

VLSI Technology and Circuits

Publications

Soumitra Joy, Kaustubh Joshi, Ahmad Zubair, Samuel Bader, Jason Peck, Michael Beumer, Pratik Koirala, Marko Radosavljevic, Heli Vora, Inanc Meric, Han Wui Then
PBTI in Scaled Oxide Submicron Enhancement Mode High-K Gallium Nitride Transistors. IRPS (2024)
Mauro J. Kobrinsky, J. D. Silva, E. Mannebach, S. Mills, M. Abd El Qader, O. Adebayo, N. Arkali Radhakrishna, M. Beasley, J. Chawla, S. Chugh, A. Dasgupta, U. Desai, E. De Re, G. Dewey, T. Edwards, C. Engel, V. Gudmundsson, Jeffery Hicks, B. Krist, R. Mehandru, Inanc Meric, Patrick Morrow, D. Nandi, P. Patel, R. Ramamurthy, D. Samanta, L. Shoer, A. St Amour, L. H. Tan, Sukru Yemenicioglu, X. Wang, T. Ghani
Novel Cell Architectures with Back-side Transistor Contacts for Scaling and Performance. VLSI Technology and Circuits (2023)
S. Mukhopadhyay, C. Chen, M. Jamil, Jihan Standfest, Inanc Meric, Balkaran Gill, Stephen Ramey
A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes. IRPS (2023)
K. Joshi, D. Nminibapiel, M. Ghoneim, D. Ali, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey
A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies. IRPS (2023)
Colin Landon, Lei Jiang, Daniel Pantuso, Inanc Meric, Kam Komeyli, Jeffrey Hicks, Daniel Schroeder
Localized thermal effects in Gate-all-around devices. IRPS (2023)
M. Jamil, S. Mukhopadhay, M. Ghoneim, A. Shailos, Chetan Prasad, Inanc Meric, Stephen Ramey
Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology. IRPS (2023)
D. Nminibapiel, K. Joshi, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey
Method to evaluate off-state breakdown in scaled Tri-gate technologies. IRPS (2022)
Neel Chatterjee, John Ortega, Inanc Meric, Peng Xiao, Ilan Tsameret
Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices. IRPS (2021)
Inanc Meric, Stephen Ramey, S. Novak, S. Gupta, S. P. Mudanai, Jeffrey Hicks
Modeling Framework for Transistor Aging Playback in Advanced Technology Nodes. IRPS (2020)
Ketul B. Sutaria, Jihan Standfest, Inanc Meric, Amirhossein H. Davoody, Swaroop Kumar Namalapuri, Trinadh Mutyala, Supriya P., Balkaran Gill, Stephen Ramey, Jeffery Hicks
Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits. IRPS (2020)
C.-Y. Su, M. Armstrong, L. Jiang, S. A. Kumar, C. D. Landon, S. Liu, Inanc Meric, K. W. Park, Leif Paulson, K. Phoa, B. Sell, Jihan Standfest, Ketul B. Sutaria, J. Wan, D. Young, Stephen Ramey
Transistor reliability characterization and modeling of the 22FFL FinFET technology. IRPS (2018)
Inanc Meric, Cory R. Dean, Nicholas Petrone, Lei Wang, James Hone, Philip Kim, Kenneth L. Shepard
Graphene Field-Effect Transistors Based on Boron-Nitride Dielectrics. Proc. IEEE 101 (7) (2013)
Kenneth L. Shepard, Inanc Meric, Philip Kim
Characterization and modeling of graphene field-effect devices. ICCAD (2008)