Stephen Ramey

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 12

Top Topics

Cmos Technology

Top Venues

Publications

Ricardo Ascázubi, Bahar Ajdari, Curtis Shirota, Stephen Ramey
Hot-Carrier Aging by Ultrafast Laser on 22FLL FinFET Technology. IRPS (2024)
S. Mukhopadhyay, C. Chen, M. Jamil, Jihan Standfest, Inanc Meric, Balkaran Gill, Stephen Ramey
A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes. IRPS (2023)
K. Joshi, D. Nminibapiel, M. Ghoneim, D. Ali, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey
A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies. IRPS (2023)
M. Jamil, S. Mukhopadhay, M. Ghoneim, A. Shailos, Chetan Prasad, Inanc Meric, Stephen Ramey
Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology. IRPS (2023)
D. Nminibapiel, K. Joshi, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey
Method to evaluate off-state breakdown in scaled Tri-gate technologies. IRPS (2022)
Inanc Meric, Stephen Ramey, S. Novak, S. Gupta, S. P. Mudanai, Jeffrey Hicks
Modeling Framework for Transistor Aging Playback in Advanced Technology Nodes. IRPS (2020)
Chen-Yi Su, Mark Armstrong, Sunny Chugh, Mohammed El-tanani, Hannes Greve, Hai Li, Mahjabin Maksud, Benjamin Orr, Christopher Perini, James Palmer, Leif Paulson, Stephen Ramey, James Waldemer, Yang Yang, Dave Young
Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology. IRPS (2020)
Peng Xiao, Haris Hadziosmanovic, Rong Jiang, Misagh Rostami-asrabad, Stephen Ramey, Ilan Tsamaret
Reliability Stressing Control Using Jacobian Feedback Kelvin Measurement on Intel Technologies. IRPS (2020)
Ketul B. Sutaria, Jihan Standfest, Inanc Meric, Amirhossein H. Davoody, Swaroop Kumar Namalapuri, Trinadh Mutyala, Supriya P., Balkaran Gill, Stephen Ramey, Jeffery Hicks
Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits. IRPS (2020)
Rohit Grover, T. Acosta, C. AnDyke, Emre Armagan, C. Auth, Sunny Chugh, K. Downes, M. Hattendorf, N. Jack, S. Joshi, R. Kasim, Gerald S. Leatherman, S.-H. Lee, C.-Y. Lin, A. Madhavan, H. Mao, A. Lowrie, G. Martin, G. McPherson, Pinakpani Nayak, A. Neale, D. Nminibapiel, Benjamin Orr, James Palmer, C. M. Pelto, S. S. Poon, I. Post, T. Pramanik, Anisur Rahman, Stephen Ramey, N. Seifert, K. Sethi, Anthony Schmitz, H. Wu, A. Yeoh
A Reliability Overview of Intel's 10+ Logic Technology. IRPS (2020)
Anisur Rahman, Javier Dacuña, Pinakpani Nayak, Gerald S. Leatherman, Stephen Ramey
Reliability studies of a 10nm high-performance and low-power CMOS technology featuring 3rd generation FinFET and 5th generation HK/MG. IRPS (2018)
C.-Y. Su, M. Armstrong, L. Jiang, S. A. Kumar, C. D. Landon, S. Liu, Inanc Meric, K. W. Park, Leif Paulson, K. Phoa, B. Sell, Jihan Standfest, Ketul B. Sutaria, J. Wan, D. Young, Stephen Ramey
Transistor reliability characterization and modeling of the 22FFL FinFET technology. IRPS (2018)
S. Novak, C. Parker, D. Becher, M. Liu, M. Agostinelli, M. Chahal, P. Packan, P. Nayak, Stephen Ramey, S. Natarajan
Transistor aging and reliability in 14nm tri-gate technology. IRPS (2015)
Stephen Ramey, M. Chahal, P. Nayak, S. Novak, C. Prasad, Jeffery Hicks
Transistor reliability variation correlation to threshold voltage. IRPS (2015)