Transistor reliability characterization and modeling of the 22FFL FinFET technology.
C.-Y. SuM. ArmstrongL. JiangS. A. KumarC. D. LandonS. LiuInanc MericK. W. ParkLeif PaulsonK. PhoaB. SellJihan StandfestKetul B. SutariaJ. WanD. YoungStephen RameyPublished in: IRPS (2018)