Transistor reliability characterization and modeling of the 22FFL FinFET technology.

C.-Y. Su M. Armstrong L. Jiang S. A. Kumar C. D. Landon S. Liu Inanc Meric K. W. Park Leif Paulson K. Phoa B. Sell Jihan Standfest Ketul B. Sutaria J. Wan D. Young Stephen Ramey

Published in: IRPS (2018)

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