A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes.
S. MukhopadhyayC. ChenM. JamilJihan StandfestInanc MericBalkaran GillStephen RameyPublished in: IRPS (2023)
Keyphrases
- unified model
- formal model
- probabilistic model
- statistical model
- conceptual framework
- computational model
- theoretical foundation
- generic model
- theoretical framework
- process model
- decision model
- modeling framework
- similarity measure
- management system
- main contribution
- parameter estimation
- case study
- conceptual model
- prior knowledge
- context dependent