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Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology.

M. JamilS. MukhopadhayM. GhoneimA. ShailosChetan PrasadInanc MericStephen Ramey
Published in: IRPS (2023)
Keyphrases
  • cmos technology
  • low power
  • power consumption
  • low voltage
  • spl times
  • parallel processing
  • high speed
  • power dissipation
  • mixed signal
  • flip flops
  • neural network
  • object oriented
  • low cost