Transistor reliability variation correlation to threshold voltage.

Stephen Ramey M. Chahal P. Nayak S. Novak C. Prasad Jeffery Hicks

Published in: IRPS (2015)

Keyphrases

silicon dioxide
high speed
power system
correlation coefficient
threshold selection
integrated circuit
power supply
transmission line
real time
low power
data sets
low cost
artificial intelligence
highly reliable
reliability analysis
genetic algorithm
low voltage
field effect transistors