Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices.
Neel ChatterjeeJohn OrtegaInanc MericPeng XiaoIlan TsameretPublished in: IRPS (2021)
Keyphrases
- machine learning
- data sets
- data distribution
- knowledge discovery
- original data
- database
- statistical methods
- test data
- data points
- prior knowledge
- data structure
- data mining
- image data
- input data
- data processing
- high dimensional data
- synthetic data
- data analysis
- small number
- text mining
- data collection
- computer systems
- missing data
- database systems
- artificial intelligence