Ilan Tsameret

Publication Activity (10 Years)

Years Active: 2015-2021
Publications (10 Years): 3

Top Topics

Metal Oxide Semiconductor

Single Instruction Multiple Data

Software Reliability

Top Venues

Publications

Neel Chatterjee, John Ortega, Inanc Meric, Peng Xiao, Ilan Tsameret
Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices. IRPS (2021)
Peng Xiao, Haris Hadziosmanovic, Michael Klessens, Rong Jiang, John Ortega, Daniel Schroeder, James Palmer, Ilan Tsameret
Customized Parallel Reliability Testing Platform with Multifold Throughput Enhancement for Intel Stressing Tests. IRPS (2021)
F. Griggio, James Palmer, F. Pan, N. Toledo, Anthony Schmitz, Ilan Tsameret, R. Kasim, Gerald S. Leatherman, Jeffery Hicks, A. Madhavan, J. Shin, J. Steigerwald, A. Yeoh, C. Auth
Reliability of dual-damascene local interconnects featuring cobalt on 10 nm logic technology. IRPS (2018)
D. Slottke, R. J. Kamaladasa, M. Harmes, Ilan Tsameret, M. Kobrinsky, Timothy McMullen, John Dunklee
Wafer-level electromigration for reliability monitoring: Quick-turn electromigration stress with correlation to package-level stress. IRPS (2015)