Customized Parallel Reliability Testing Platform with Multifold Throughput Enhancement for Intel Stressing Tests.
Peng XiaoHaris HadziosmanovicMichael KlessensRong JiangJohn OrtegaDaniel SchroederJames PalmerIlan TsameretPublished in: IRPS (2021)
Keyphrases
- computer architecture
- multi core processors
- test cases
- test suite
- test generation
- code coverage
- response time
- test data
- parallel architecture
- parallel processing
- software reliability
- real time
- parallel implementation
- parallel programming
- image enhancement
- statistical tests
- software testing
- data sets
- single instruction multiple data
- shared memory
- test set
- image processing
- parallel computation
- multiple choice
- massively parallel
- end to end
- reliability analysis
- regression testing
- wireless sensor networks
- genetic algorithm