P. J. Liao

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 7

Top Topics

Statistical Learning

Reliability Assessment

Top Venues

Publications

H. C. Chang, P. J. Liao, S. H. Chen, Y. K. Chang, C. P. Li, W. C. Liao, M. H. Hsieh, H. W. Yang, J. H. Lee, C. M. Huang, Jun He
Enhancing EM Reliability and Lifetime Modeling: A Multi-Link Structure Approach. IRPS (2024)
P. C. Chang, P. J. Liao, C. H. Wu, Y. C. Chang, D. H. Hou, Elia Ambrosi, H. Y. Lee, J. H. Lee, X. Y. Bao
A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation. IRPS (2023)
Y. K. Chang, P. J. Liao, S. H. Yeong, Y.-M. Lin, J. H. Lee, C. T. Lin, Z. Yu, W. Tsai, P. C. McIntyre
The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics. IRPS (2022)
P. C. Chang, P. J. Liao, D. W. Heh, C. Lee, D. H. Hou, Elia Ambrosi, C. H. Wu, H. Y. Lee, J. H. Lee, Xinyu Bao
Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector. IRPS (2022)
Yung-Huei Lee, P. J. Liao, Vincent Hou, Dawei Heh, Chih-Hung Nien, Wen-Hsien Kuo, Gary T. Chen, Shao-Ming Yu, Yu-Sheng Chen, Jau-Yi Wu, Xinyu Bao, Carlos H. Diaz
Composition Segregation of Ge-Rich GST and Its Effect on Reliability. IRPS (2021)
Kaustubh Joshi, Yung-Huei Lee, Yu-Cheng Yao, Shu-Wen Chang, Siao-Syong Bian, P. J. Liao, Jiaw-Ren Shih, Min-Jan Chen
A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. IRPS (2019)
Kaustubh Joshi, Shu-Wen Chang, D. S. Huang, P. J. Liao, Yung-Huei Lee
Study of dynamic TDDB in scaled FinFET technologies. IRPS (2018)