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A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates.

Kaustubh JoshiYung-Huei LeeYu-Cheng YaoShu-Wen ChangSiao-Syong BianP. J. LiaoJiaw-Ren ShihMin-Jan Chen
Published in: IRPS (2019)
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