Yung-Huei Lee

Publication Activity (10 Years)

Years Active: 2001-2021
Publications (10 Years): 5

Top Topics

High Efficiency

Semiconductor Devices

Software Reliability

Association Rules

Top Venues

Microelectron. Reliab.

Publications

Yung-Huei Lee, P. J. Liao, Vincent Hou, Dawei Heh, Chih-Hung Nien, Wen-Hsien Kuo, Gary T. Chen, Shao-Ming Yu, Yu-Sheng Chen, Jau-Yi Wu, Xinyu Bao, Carlos H. Diaz
Composition Segregation of Ge-Rich GST and Its Effect on Reliability. IRPS (2021)
Shih-che Hung, Shih-Chang Chen, Pei-Shan Chien, Yu-Sheng Cho, Yung-Huei Lee, Wei-Shuo Hung
Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress (TRVS) Method for Automotive Applications. IRPS (2021)
Kaustubh Joshi, Yung-Huei Lee, Yu-Cheng Yao, Shu-Wen Chang, Siao-Syong Bian, P. J. Liao, Jiaw-Ren Shih, Min-Jan Chen
A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. IRPS (2019)
Kaustubh Joshi, Shu-Wen Chang, D. S. Huang, P. J. Liao, Yung-Huei Lee
Study of dynamic TDDB in scaled FinFET technologies. IRPS (2018)
Subhadeep Mukhopadhyay, Yung-Huei Lee, Jen-Hao Lee
Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability. Microelectron. Reliab. 81 (2018)
Yin-Lung Ryan Lu, Yung-Huei Lee, William J. Mcmahon, Tze-Ching Fung
Robust Inductor Design for RF Circuits. CICC (2006)
Yung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal R. Mielke, Ramez Nachman
The impact of PMOST bias-temperature degradation on logic circuit reliability performance. Microelectron. Reliab. 45 (1) (2005)
Yung-Huei Lee, Tom Linton, Ken Wu, Neal R. Mielke
Effect of trench edge on pMOSFET reliability. Microelectron. Reliab. 41 (5) (2001)