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Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability.

Subhadeep MukhopadhyayYung-Huei LeeJen-Hao Lee
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • semiconductor devices
  • high speed
  • field effect transistors
  • social networks
  • information systems
  • data sets
  • information retrieval
  • artificial intelligence
  • circuit design
  • reliability analysis
  • analog vlsi