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Subhadeep Mukhopadhyay
ORCID
Publication Activity (10 Years)
Years Active: 2018-2018
Publications (10 Years): 1
Top Topics
Semiconductor Devices
Reliability Analysis
Circuit Design
Top Venues
Microelectron. Reliab.
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Publications
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Subhadeep Mukhopadhyay
,
Yung-Huei Lee
,
Jen-Hao Lee
Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability.
Microelectron. Reliab.
81 (2018)