Neal R. Mielke

Publication Activity (10 Years)

Years Active: 2001-2017
Publications (10 Years): 1

Top Topics

Multi Dimensional

Top Venues

Publications

Neal R. Mielke, Robert E. Frickey, Ivan Kalastirsky, Minyan Quan, Dmitry Ustinov, Venkatesh J. Vasudevan
Reliability of Solid-State Drives Based on NAND Flash Memory. Proc. IEEE 105 (9) (2017)
Yung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal R. Mielke, Ramez Nachman
The impact of PMOST bias-temperature degradation on logic circuit reliability performance. Microelectron. Reliab. 45 (1) (2005)
Yung-Huei Lee, Tom Linton, Ken Wu, Neal R. Mielke
Effect of trench edge on pMOSFET reliability. Microelectron. Reliab. 41 (5) (2001)