The impact of PMOST bias-temperature degradation on logic circuit reliability performance.
Yung-Huei LeeSteve JacobsStefan StadlerNeal R. MielkeRamez NachmanPublished in: Microelectron. Reliab. (2005)
Keyphrases
- digital circuits
- logic synthesis
- logic circuits
- delay insensitive
- high speed
- logic programming
- asynchronous circuits
- analog circuits
- circuit design
- modal logic
- electronic circuits
- high temperature
- multi valued
- duty cycle
- transient response
- reliability analysis
- control system
- failure rate
- logical framework
- relative humidity