Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress (TRVS) Method for Automotive Applications.
Shih-che HungShih-Chang ChenPei-Shan ChienYu-Sheng ChoYung-Huei LeeWei-Shuo HungPublished in: IRPS (2021)