P. C. Chang

Publication Activity (10 Years)

Years Active: 2001-2023
Publications (10 Years): 5

Top Topics

Intelligent Search

Top Venues

Int. J. Comput. Integr. Manuf.

Visual Information Processing and Communication

Publications

P. C. Chang, P. J. Liao, C. H. Wu, Y. C. Chang, D. H. Hou, Elia Ambrosi, H. Y. Lee, J. H. Lee, X. Y. Bao
A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation. IRPS (2023)
P. C. Chang, P. J. Liao, D. W. Heh, C. Lee, D. H. Hou, Elia Ambrosi, C. H. Wu, H. Y. Lee, J. H. Lee, Xinyu Bao
Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector. IRPS (2022)
Z. H. Che, H. S. Wang, P. C. Huang, P. C. Chang, Y. S. Lee
Application of Particle Swarm Optimization to Solve Configuration Change Problems. IIAI-AAI (2018)
N. R. Li, K. W. Liang, Z. Y. Chen, H. Y. Jiang, J. T. Fang, P. C. Chang
A Fast TU Mode Decision Algorithm Based on Residual Difference for HEVC. Visual Information Processing and Communication (2017)
Vijaya Kumar Manupati, P. C. Chang, Manoj Kumar Tiwari
Intelligent search techniques for network-based manufacturing systems: multi-objective formulation and solutions. Int. J. Comput. Integr. Manuf. 29 (8) (2016)
Lino Becerra, P. C. Chang, James Bishop, David Borsook
CNS activation maps in awake rats exposed to thermal stimuli to the dorsum of the hindpaw. NeuroImage 54 (2) (2011)
Jia-Lun Wang, P. C. Chang, Shinn-Yan Lin, Huang-Tien Lin, Chia-Shu Liao
Remote time and frequency calibration system for telecommunication synchronization applications. APNOMS (2011)
Y. D. Jhou, C. H. Chen, S. J. Chang, Y. K. Su, P. C. Chang, P. C. Chen, H. Hung, C. L. Yu, S. M. Wang, M. H. Wu
GaN MSM photodetectors with photo-CVD annealed Ni/Au electrodes. Microelectron. J. 37 (4) (2006)
T. Warren Liao, Evangelos Triantaphyllou, P. C. Chang
Detection of Welding Flaws With MLP Neural Network and Case Based Reasoning. Intell. Autom. Soft Comput. 9 (4) (2003)
W. D. Zhuang, P. C. Chang, F. Y. Chou, R. K. Shiue
Effect of solder creep on the reliability of large area die attachment. Microelectron. Reliab. 41 (12) (2001)