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Vipin Joshi
ORCID
Publication Activity (10 Years)
Years Active: 2019-2023
Publications (10 Years): 7
Top Topics
Root Cause
Electric Field
Schottky Barrier
Structuring Elements
Top Venues
IRPS
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Publications
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Rajarshi Roy Chaudhuri
,
Vipin Joshi
,
Amratansh Gupta
,
Tanmay Joshi
,
Rasik Rashid Malik
,
Mehak Ashraf Mir
,
Sayak Dutta Gupta
,
Mayank Shrivastava
Unique Lattice Temperature Dependent Evolution of Hot Electron Distribution in GaN HEMTs on C-doped GaN Buffer and its Reliability Consequences.
IRPS
(2023)
Harsh Raj
,
Vipin Joshi
,
Rajarshi Roy Chaudhuri
,
Rasik Rashid Malik
,
Mayank Shrivastava
Physical Insights into the DC and Transient Reverse Bias Reliability of β-Ga2O3 Based Vertical Schottky Barrier Diodes.
IRPS
(2023)
Mehak Ashraf Mir
,
Vipin Joshi
,
Rajarshi Roy Chaudhuri
,
Mohammad Ateeb Munshi
,
Rasik Rashid Malik
,
Mayank Shrivastava
Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs.
IRPS
(2023)
Vipin Joshi
,
Sayak Dutta Gupta
,
Rajarshi Roy Chaudhuri
,
Mayank Shrivastava
Unique Dependence of the Breakdown Behavior of Normally-OFF Cascode AlGaN/GaN HEMTs on Carrier Transport Through the Carbon-Doped GaN Buffer.
IRPS
(2023)
Rasik Rashid Malik
,
Vipin Joshi
,
Rajarshi Roy Chaudhuri
,
Mehak Ashraf Mir
,
Zubear Khan
,
Avinas N. Shaji
,
Madhura Bhattacharya
,
Anup T. Vitthal
,
Mayank Shrivastava
Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs.
IRPS
(2023)
Sayak Dutta Gupta
,
Vipin Joshi
,
Rajarshi Roy Chaudhuri
,
Anant kr Singh
,
Sirsha Guha
,
Mayank Shrivastava
On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs.
IRPS
(2020)
Sayak Dutta Gupta
,
Vipin Joshi
,
Bhawani Shankar
,
Swati Shikha
,
Srinivasan Raghavan
,
Mayank Shrivastava
UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities.
IRPS
(2019)