Physical Insights into the DC and Transient Reverse Bias Reliability of β-Ga2O3 Based Vertical Schottky Barrier Diodes.
Harsh RajVipin JoshiRajarshi Roy ChaudhuriRasik Rashid MalikMayank ShrivastavaPublished in: IRPS (2023)
Keyphrases
- schottky barrier
- field effect transistors
- genetic algorithm ga
- steady state
- semiconductor devices
- high density
- genetic algorithm
- fitness function
- multi objective
- hybrid algorithm
- hybrid genetic algorithm
- tabu search
- simulated annealing
- evolutionary computation
- optimization method
- crossover operator
- physical world
- failure rate
- machine learning
- particle swarm optimization
- artificial neural networks
- hybrid ga
- initial population
- fuzzy logic
- genetic programming