Bhawani Shankar

Publication Activity (10 Years)

Years Active: 2017-2022
Publications (10 Years): 7

Top Topics

Monocular Images

Structuring Elements

Monitoring System

Top Venues

Autonomous Vehicles and Machines

Publications

Bhawani Shankar, Ke Zeng, Brendan Gunning, Rafael Perez Martinez, Chuanzhe Meng, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar, Srabanti Chowdhury
Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress. DRC (2022)
Bhawani Shankar, Zhengliang Bian, Ke Zeng, Chuanzhe Meng, Rafael Perez Martinez, Srabanti Chowdhury, Brendan Gunning, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar
Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization. IRPS (2022)
Sayak Dutta Gupta, Vipin Joshi, Bhawani Shankar, Swati Shikha, Srinivasan Raghavan, Mayank Shrivastava
UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities. IRPS (2019)
Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, R. Sengupta, H. Khand, N. Mohan, Srinivasan Raghavan, Mayank Shrivastava
On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs. IRPS (2018)
Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, Mayank Shrivastava
Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs. IRPS (2018)
Bhawani Shankar, Dakala Jayachandra, Kalyan Kumar Hati
Face Pose Estimation From Rigid Face Landmarks For Driver Monitoring Systems. Autonomous Vehicles and Machines (2017)
Bhawani Shankar, Ankit Soni, Manikant Singh, Rohith Soman, K. N. Bhat, Srinivasan Raghavan, Navakanta Bhat, Mayank Shrivastava
ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis. VLSI Design (2017)