Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress.
Bhawani ShankarKe ZengBrendan GunningRafael Perez MartinezChuanzhe MengJack FlickerAndrew BinderJeramy Ray DickersonRobert KaplarSrabanti ChowdhuryPublished in: DRC (2022)