Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization.
Bhawani ShankarZhengliang BianKe ZengChuanzhe MengRafael Perez MartinezSrabanti ChowdhuryBrendan GunningJack FlickerAndrew BinderJeramy Ray DickersonRobert KaplarPublished in: IRPS (2022)