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UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities.

Sayak Dutta GuptaVipin JoshiBhawani ShankarSwati ShikhaSrinivasan RaghavanMayank Shrivastava
Published in: IRPS (2019)
Keyphrases
  • user interface
  • higher level
  • neural network
  • steady state
  • levels of abstraction
  • threshold selection
  • high speed
  • direct manipulation
  • friendly interface