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On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs.

Bhawani ShankarAnkit SoniSayak Dutta GuptaR. SenguptaH. KhandN. MohanSrinivasan RaghavanMayank Shrivastava
Published in: IRPS (2018)
Keyphrases
  • real time
  • image processing
  • multiresolution
  • databases
  • neural network
  • decision making
  • case study
  • bayesian networks
  • structuring elements