Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs.
Rasik Rashid MalikVipin JoshiRajarshi Roy ChaudhuriMehak Ashraf MirZubear KhanAvinas N. ShajiMadhura BhattacharyaAnup T. VitthalMayank ShrivastavaPublished in: IRPS (2023)