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Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs.

Rasik Rashid MalikVipin JoshiRajarshi Roy ChaudhuriMehak Ashraf MirZubear KhanAvinas N. ShajiMadhura BhattacharyaAnup T. VitthalMayank Shrivastava
Published in: IRPS (2023)
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