Unique Lattice Temperature Dependent Evolution of Hot Electron Distribution in GaN HEMTs on C-doped GaN Buffer and its Reliability Consequences.
Rajarshi Roy ChaudhuriVipin JoshiAmratansh GuptaTanmay JoshiRasik Rashid MalikMehak Ashraf MirSayak Dutta GuptaMayank ShrivastavaPublished in: IRPS (2023)