Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs.
Mehak Ashraf MirVipin JoshiRajarshi Roy ChaudhuriMohammad Ateeb MunshiRasik Rashid MalikMayank ShrivastavaPublished in: IRPS (2023)