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Nam-Hyun Lee
Publication Activity (10 Years)
Years Active: 2016-2024
Publications (10 Years): 6
Top Topics
High Temperature
Top Venues
IRPS
Microelectron. Reliab.
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Publications
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Sunhang Lee
,
Nam-Hyun Lee
,
G.-J. Kim
,
J. Ahn
,
Ik-Hwan Kim
,
S. Ha
,
S. Rhee
,
GH Bae
,
KW Lee
,
YS Lee
,
SB. Ko
,
S. Pae
Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology.
IRPS
(2024)
Donghee Son
,
Gang-Jun Kim
,
Jongkyun Kim
,
Nam-Hyun Lee
,
Kijin Kim
,
Sangwoo Pae
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM.
IRPS
(2021)
Nam-Hyun Lee
,
Jongkyun Kim
,
Donghee Son
,
Kangjun Kim
,
Jung Eun Seok
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM.
IRPS
(2019)
Gang-Jun Kim
,
Nam-Hyun Lee
,
Jongkyun Kim
,
Jung Eun Seok
,
Yunsung Lee
Effect of DC/AC stress on the reliability of cell capacitor in DRAM.
Microelectron. Reliab.
(2018)
Donghee Son
,
Gang-Jun Kim
,
Ji-Hoon Seo
,
Nam-Hyun Lee
,
YongHa Kang
,
Bongkoo Kang
Degradation of pMOSFETs due to hot electron induced punchthrough.
Microelectron. Reliab.
59 (2016)
Donghee Son
,
Gang-Jun Kim
,
Ji-Hoon Seo
,
Nam-Hyun Lee
,
YongHa Kang
,
Bongkoo Kang
Channel width dependence of AC stress on bulk nMOSFETs.
Microelectron. Reliab.
64 (2016)