Nam-Hyun Lee

Publication Activity (10 Years)

Years Active: 2016-2024
Publications (10 Years): 6

Top Topics

High Temperature

Top Venues

Microelectron. Reliab.

Publications

Sunhang Lee, Nam-Hyun Lee, G.-J. Kim, J. Ahn, Ik-Hwan Kim, S. Ha, S. Rhee, GH Bae, KW Lee, YS Lee, SB. Ko, S. Pae
Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology. IRPS (2024)
Donghee Son, Gang-Jun Kim, Jongkyun Kim, Nam-Hyun Lee, Kijin Kim, Sangwoo Pae
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM. IRPS (2021)
Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM. IRPS (2019)
Gang-Jun Kim, Nam-Hyun Lee, Jongkyun Kim, Jung Eun Seok, Yunsung Lee
Effect of DC/AC stress on the reliability of cell capacitor in DRAM. Microelectron. Reliab. (2018)
Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang
Degradation of pMOSFETs due to hot electron induced punchthrough. Microelectron. Reliab. 59 (2016)
Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang
Channel width dependence of AC stress on bulk nMOSFETs. Microelectron. Reliab. 64 (2016)