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Nam-Hyun Lee
Publication Activity (10 Years)
Years Active: 2016-2021
Publications (10 Years): 5
Top Topics
Microscopic Images
Multiresolution
Noisy Channel
High Temperature
Top Venues
Microelectron. Reliab.
IRPS
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Publications
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Donghee Son
,
Gang-Jun Kim
,
Jongkyun Kim
,
Nam-Hyun Lee
,
Kijin Kim
,
Sangwoo Pae
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM.
IRPS
(2021)
Nam-Hyun Lee
,
Jongkyun Kim
,
Donghee Son
,
Kangjun Kim
,
Jung Eun Seok
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM.
IRPS
(2019)
Gang-Jun Kim
,
Nam-Hyun Lee
,
Jongkyun Kim
,
Jung Eun Seok
,
Yunsung Lee
Effect of DC/AC stress on the reliability of cell capacitor in DRAM.
Microelectron. Reliab.
(2018)
Donghee Son
,
Gang-Jun Kim
,
Ji-Hoon Seo
,
Nam-Hyun Lee
,
YongHa Kang
,
Bongkoo Kang
Degradation of pMOSFETs due to hot electron induced punchthrough.
Microelectron. Reliab.
59 (2016)
Donghee Son
,
Gang-Jun Kim
,
Ji-Hoon Seo
,
Nam-Hyun Lee
,
YongHa Kang
,
Bongkoo Kang
Channel width dependence of AC stress on bulk nMOSFETs.
Microelectron. Reliab.
64 (2016)