Jongkyun Kim

Publication Activity (10 Years)

Years Active: 2013-2021
Publications (10 Years): 4

Top Topics

Microscopic Images

Parametric Family

Pulse Width Modulation

Top Venues

Microelectron. Reliab.

IEICE Electron. Express

Publications

Donghee Son, Gang-Jun Kim, Jongkyun Kim, Nam-Hyun Lee, Kijin Kim, Sangwoo Pae
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM. IRPS (2021)
Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM. IRPS (2019)
Jongkyun Kim, Namhyun Lee, Gang-Jun Kim, Young-Yun Lee, Jung-Eun Seok, Yunsung Lee
Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. Microelectron. Reliab. (2018)
Gang-Jun Kim, Nam-Hyun Lee, Jongkyun Kim, Jung Eun Seok, Yunsung Lee
Effect of DC/AC stress on the reliability of cell capacitor in DRAM. Microelectron. Reliab. (2018)
Youngcheol Park, Jongkyun Kim
A small-sized class-J power amplifier from combined multi-harmonic voltage reflection functions. IEICE Electron. Express 10 (8) (2013)