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Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM.

Jongkyun KimNamhyun LeeGang-Jun KimYoung-Yun LeeJung-Eun SeokYunsung Lee
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • high speed
  • main memory
  • data sets
  • information systems
  • case study
  • state space
  • management system
  • analog circuits